This shows you the differences between two versions of the page.

Link to this comparison view

seminars:seminar_3_8_17 [2017/09/20 22:02] (current)
Line 1: Line 1:
 +====== Improving the Reliability of Chip-Off Forensic Analysis of NAND Flash Memory Devices ======
 +Wednesday March 8, 2017\\
 +Location: CIC Panther Hollow Room\\
 +Time: 4:30PM\\
 +**Aya Fukami (CMU & National Police Agency of Japan)**\\
 +Digital forensics investigators often need to extract data from
 +physically damaged devices.  In such cases, investigators turn to
 +chip-off forensic analysis, which uses a thermal-based procedure to
 +physically remove the NAND flash memory chip from the device, so that
 +raw data can be directly extracted from the chip.  The first half of
 +this talk will present issues related to chip-off analysis, examining
 +the errors introduced in NAND flash memory in the time between device
 +seizure and data extraction, as well as the errors introduced by the
 +thermal-based chip removal process itself.  In order to mitigate the
 +various errors observed during the chip-off analysis process, we
 +evaluated the effectiveness of read-retry, a hardware-based mechanism
 +implemented in modern NAND flash memory chips. The second half of this
 +talk will explain how investigators can leverage read-retry mechanisms
 +in order to improve the reliability of chip-off forensic analysis.
 +Aya Fukami is a visiting researcher at Carnegie Mellon University
 +CyLab.  She is also a digital forensic scientist at the National
 +Police Agency of Japan, where she has been conducting low-level data
 +recovery from digital devices for criminal investigations.  Her
 +current research interest is in NAND Flash memory reliability,​
 +especially how temperature affects the device-level operation.  She
 +received a BSc in Computer Science from Kitakyushu University, and an
 +MSc in Electrical Engineering from George Washington University,
 +**[[seminars| Back to the seminar page]]**